| Ref. |
Title |
|
Authors |
| P113 |
Trace Element Micro-Analysis by
Transmission X-ray Microtomography using Absorption Edges |
|
K.
Okuno, T. Ohigashi, S. Kamiyama, S. Hirai, J.
Matsubara, N. Watanabe, S. Aoki |
| P114 |
Development of high speed
microtomography system with high definition detector |
|
K.
Uesugi, T. Sera, N. Yagi, Y. Suzuki |
| P115 |
High-Resolution X-Ray Imaging
Microtomography with Fresnel Zone Plate Optics at SPring-8 |
|
A.
Takeuchi, K. Uesugi, Y. Suzuki, S. Tamura, N. Kamijo |
| P116 |
CT reconstruction by diffraction
correction in soft X-ray projection microscopy |
|
T.
Shiina, K. Hotta, Y. Tsuge, T. Honda, H. Yoshimura,
Y. Kinjo, A. Ito |
| P117 |
Depth of Field Techniques for
3-Dimensional Imaging |
|
A.
E. Sakdinawat, M. A. LeGros, W. Chao, E. H.
Anderson, P. Fischer, D. Attwood |
| P118 |
X-ray Fluorescence Scanning
Microscope and Micro-Tomography with a Zone Plate |
|
N.
Watanabe, M. Sato, M. Hoshino, Y. Takeda, S. Aoki,
A. Takeuchi, Y. Suzuki |
| P119 |
Preliminary Results of Hard X-ray
Phase-contrast Imaging |
|
S.
Jiang, Y. Chen, L. Chen, L. Wan, F. Xu |
| P120 |
Refractive Contrast in X-ray
Diffraction Enhanced Imaging |
|
X.
Jiang, L. Gang, Z.
Chen, J. Tang |
| P121 |
Contrast Enhance Imaging with
Micro-focus X-ray Generator and CCD |
|
K.
Torii, H. Tsunemi |
| P122 |
Recent development on X-ray phase
contrast imaging in China |
|
J.
Chen, H. Gao, H. Zhu, H. Gan, R. Li, Z. Xu |
| P123 |
Effect of Fresnel Illumination on
Oversampling Iteration Method |
|
Y.
Kohmura, Y. Nishino, T. Ishikawa |
| P124 |
Digital Phase Difference
Amplification in X-ray Interferometer |
|
H.
Gao, J. Chen, H. Zhu, H. Gan, R. Li, Z. Xu |
| P125 |
Development of an apparatus for
speckle image observations near the X-ray diffraction spots using
focusing beam. |
|
T.
Suzuki, H. Takano, A. Takeuchi, K. Uesugi, S. Shin,
Y. Suzuki |
| P126 |
Study of Matrix Effect with a
Full-Field Imaging X-ray Fluorescence Microscope |
|
T.
Ohigashi, M. Hoshino, Y. Takeda, N. Yamada, T.
Namiki, T. Ishino, N. Watanabe, S. Aoki |
| P127 |
Integrated Image Projection and
Detector Array for Real-time Quantitative Synchrotron XRF Elemental
Imaging using the X-ray Microprobe |
|
C.
G. Ryan, D. P. Siddons, P. A. Dunn, B. E.
Etschmann, S. Vogt, J. Maser, C. L. Harland |
| P128 |
Reproduction of Hologram Image
Using A Zone Plate for Hard X-ray Radiation |
|
A.
V. Kuyumchyan, A. Y. Souvorov, T. Ishikawa, A. A.
Isoyan, V. V. Aristov, K. Trouni, E. Sarkisian |
| P129 |
X-ray waveguide optics for x-ray
in-line holo-microscopy |
|
C.
Fuhse, C. Ollinger , A. Jarre, T. Salditt |
| P130 |
Phase Imaging with X-ray Talbot
Interferometer Using Gratings Fabricated with LIGA Process |
|
W.
Yashiro, A. Momose, Y. Suzuki, T. Hattori |
| P131 |
Biomedical phase imaging using a
grating interferometer |
|
C.
David, T. Weitkamp, T. Khan, F. Pfeiffer, O. Bunk,
A. Diaz, T. Rohbeck, A. Groso, M. Stampanoni |
| P132 |
Extreme Ultraviolet Phase Contrast
Imaging |
|
G.
Denbeaux, A. Barty, Y. Liu, R. Garg, O. Wood |
| P133 |
Development of a Large Angle X-ray
Spreading Element for Projection X-ray Microscopy with undulator Light
Source |
|
M.
Awaji |
| P134 |
Submicron-Resolution X-ray
Topography Using Fresnel-Zone-Plate Magnification |
|
R.
Tanuma, T. Kubo, A. Saito |
| P135 |
Crystallinity Estimation of
Strained-Si Wafers by Using Highly Parallel X-Ray Microbeam |
|
Y.
Tsusaka, K. Fukuda, N. Tomita, K. Hayashi, Y.
Kagoshima, J. Matsui, A. Ogura |
| P136 |
High Resolution X-Ray Inspection
Microscope equipped with a Field Emission Gun and its Application |
|
Y.
Saito, H. Kai, K. Shirota, K. Yada |
| P137 |
XFH study of dilute system using
cooled APD |
|
K.
Hayashi, Y. Takahashi, E. Matsubara, I. Yonenaga,
S. Kishimo |
| P138 |
Spectroscopic Photoemission and
Low Energy Electron Microscope (SPELEEM) at MAX-Lab |
|
A.
A. Zakharov, R. Nyholm, U. Johansson, J. Andersen,
A. Mikkelsen |
| P139 |
Scanning Transmission X-ray
Microscopy with Momentum Analyzer |
|
Y.
Suzuki, A. Takeuchi, H. Takano |
| P140 |
Scanning μ-x ray excited
luminescence in semiconductors |
|
G.
Martinez-Criado, B. Alen, A. Homs, A. Somogyi, C.
Miskys, J. Susini, R. Tucoulou |
| P141 |
Evaluation of Hard X-Ray Con-Focal
Optics |
|
H.
Takano, Y. Suzuki, K. Uesugi, A. Takeuchi |
| P142 |
Towards table-top time-resolved
soft x-ray microscopy imaging with a laboratory high-harmonic source at
100 eV |
|
M.
Wieland, T. Wilhein, C.
Spielmann, U. Kleineberg, T.
Westerwalbesloh, U. Heinzmann |
| P143 |
Hard X-ray Interference Microscope
with Two Zone Plates |
|
N.
Watanabe, M. Hoshino, M. Sato, Y.
Takeda, T. Namiki, S. Aoki, A. Takeuchi,
Y. Suzuki |
| P144 |
Reflection Mode Imaging with High
Resolution X-ray Microscopy |
|
G.
Denbeaux, P. Fischer, F. Salmassi |
| P145 |
Projection-type micro X-ray
fluorescence and diffraction imaging |
|
K.
Sakurai |
| P146 |
Nanometer Focusing using
Diffractive X-ray Optics |
|
J.
Maser, S. Vogt, B. Stephenson, A. Macrander |
| P147 |
The focusing limits of Fresnel
Zone Plate x-ray optics |
|
F.
Pfeiffer, C. Bergemann, J. F. van der Veen |
| P148 |
Hard x-ray micro focusing with a
single bounce multilayer optic |
|
F.
Pfeiffer, H. Keymeulen, A. Diaz, C. David,
XenocsMember1, XenocsMember2, P. Høghøj |
| P149 |
Improving spatial resolution of
x-ray microscopy using direct demodulation method. |
|
G.
Li, Z. Y. Wu, M. Ando, D.C. Xian |
| P150 |
Design and Performance of
Multilayer Coating on the Blazed Grating in 25 - 80 nm Region |
|
K.
Saito, Y. Kondo, H. Takenaka, J. Azuma, K.
Takahashi, M. Kamada |
| P151 |
Synchrotron infrared
microspectroscopic imaging of biological sample |
|
Y.
C. Lee, C. I. Chen |
| P152 |
High Sensitivity Chemically
Amplified Resist for EUV Lithography |
|
T.
Watanabe, H. Kinoshita, H. Hada, H. Komano |
